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Siegel, Eliot L.
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2010
RECIST versus volume measurement in medical CT using ellipsoids of known size
,
Z. H. Levine
,
B. R. Borchardt
,
N. J. Brandenburg
,
C. W. Clark
,
B. Muralikrishnan
,
C. M. Shakarji
,
J. J. Chen
, and
E. L. Siegel
,
Optics Express
,
18
, 8151 (2010)
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