|Title||Accessing ratios of quantized resistances in graphene p-n junction devices using multiple terminals|
|Publication Type||Journal Article|
|Year of Publication||2020|
|Authors||D. Patel, M. Marzano, , H. M. Hill, M. Kruskopf, H. Jin, J. Hu, D. B. Newell, C-T. Liang, R. Elmquist, and A. F. Rigosi|
|Date Published||FEB 1|
|Type of Article||Article|
The utilization of multiple current terminals on millimeter-scale graphene p-n junction devices has enabled the measurement of many atypical, fractional multiples of the quantized Hall resistance at the v = 2 plateau (R-H approximate to 12 906 Omega). These fractions take the form a/bR(H) and can be determined both analytically and by simulations. These experiments validate the use of either the LTspice circuit simulator or the analytical framework recently presented in similar work. Furthermore, the production of several devices with large-scale junctions substantiates the approach of using simple ultraviolet lithography to obtain junctions of sufficient sharpness. (C) 2020 Author(s).