Weak localization thickness measurements of Si:P delta-layers

TitleWeak localization thickness measurements of Si:P delta-layers
Publication TypeJournal Article
Year of Publication2004
AuthorsD. F. Sullivan, B. E. Kane, and P. E. Thompson
JournalApplied Physics Letters
Volume85
Issue26
Pagination6362
Date Published2004
ISSN00036951
DOI10.1063/1.1842366
Short TitleAppl. Phys. Lett.