Detection of a single-charge defect in a metal-oxide-semiconductor structure using vertically coupled Al and Si single-electron transistors

TitleDetection of a single-charge defect in a metal-oxide-semiconductor structure using vertically coupled Al and Si single-electron transistors
Publication TypeJournal Article
Year of Publication2009
AuthorsL. Sun, and B. Kane
JournalPhysical Review B
Volume80
Issue15
Date Published10/2009
ISSN1098-0121
DOI10.1103/PhysRevB.80.153310
Short TitlePhys. Rev. B