An Atom Trap Trace Analysis (ATTA) system to measure trace contamination of XENON dark matter detector by Kr
In the XENON dark matter search experiment, trace contamination of Xe by Kr contributes background events through the beta decay of radioactive Kr-85. To achieve the required sensitivity of the detector, the contamination must be reduced below the part per trillion (ppt) level. We have developed an atom trap trace analysis (ATTA) device to detect Kr below the ppt level.
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